Roughness measuring device probeHommel
P 2FE 30 P2F E 100
Roughness measuring device probe
Hommel
P 2FE 30 P2F E 100
fixed price plus VAT
€125
Condition
Used
Location
Wiefelstede 

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Machine data
- Machine type:
- Roughness measuring device probe
- Manufacturer:
- Hommel
- Model:
- P 2FE 30 P2F E 100
- Condition:
- good (used)
Price & Location
fixed price plus VAT
€125
- Location:
- 26215 Wiefelstede, DE

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Details about the offer
- Listing ID:
- A921-1358
- Reference number:
- 30459
- Update:
- 16.01.2026
Description
Contour measuring device, contour measuring device, contourograph, contourograph, roughness measuring device, roughness measurement, roundness measurement, roughness probe
-Manufacturer: Hommel, measuring probe for roughness measuring device
-Measuring probe: Type P2FE 30 / P2F E 100
-Individual components: see photos
-Box dimensions: 235/105/H30 mm
-Weight: 0.4 kg
Nsdpfx Aok Hdr Tofcjwc
-Manufacturer: Hommel, measuring probe for roughness measuring device
-Measuring probe: Type P2FE 30 / P2F E 100
-Individual components: see photos
-Box dimensions: 235/105/H30 mm
-Weight: 0.4 kg
Nsdpfx Aok Hdr Tofcjwc
Seller
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Registered since: 2002
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