Used Zeiss Scanning Electron Microscope Zeiss Xb350 for sale (7,571)

Condition: like new (used), Year of construction: 2024, functionality: fully functional, Scanning Electron Microscope (SEM) Zeiss XB 350 Configuration and Accessories • Without FIB Column • SmartSEM- and SmartFIB-Software • GIS with Pt Precursor • Integrated Plasma Cleaner • EDS Oxford Xplore 30 (incl. Interface & Software) • Automatically 200 mm Air Lock • Electrical Feed-Through (2 x 15 Channels) • Circulation Cooling • Vacuum Buffer Tank (Quiet Mode) • ... and Table, Screen, Control Panel (i.e. Unique Zeiss Keyboard + Joystick) and Misc. Probe Holders Launch: August 2024 Laedpfow Rdvvsx Aiiob Site: Germany, Mainz Available at short notice by arrangement. The SEM is still in operation and can be viewed and demonstrated. The device has no defects or quirks and is fully functional. Further information available on request!

Condition: excellent (used), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional. Instrument configuration includes the following features: • Magnification range: 5x – 300,000x • Acceleration voltage: 0.3 – 30 kV • Tungsten filament cathode (LaB6 cathode optional) • Large fully motorized sample stage with eccentric tilt capability, including: – Graphic navigation on the sample holder – Easy sample navigation via click-center-zoom – Field-of-view controlled navigation via two navigators – Relative coordinate navigation – Save and recall of sample positions – Adjustable stage field-of-view selection • Field-of-view correction during rotation via computer-driven eccentric rotation • Field-of-view correction during tilting via computer-driven eccentric tilting • Calculation of the possible tilt angle based on sample geometry • Automatic focus tracking when moving the sample in the Z-axis • Intelligent limit switches for all motorized axes • Stage travel: X = 125 mm Y = 100 mm Z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) • Secondary electron detector for high vacuum operation • Newly designed, super-conical objective lens for optimal resolution at high tilt angles • Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV • Simultaneous live imaging with multiple detectors • Powerful image measurement functions • Movie function for recording dynamic processes • Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc. • Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control • Comprehensive safety procedures against misuse and external media failure • Ergonomic, height-adjustable system table • SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments Additional equipment for SEM: • Turbomolecular pump (instead of standard diffusion pump) – Use of a turbomolecular pump eliminates the need for cooling water during SEM operation. Further SEM equipment: • PC for SEM control including TFT monitor • ΟΧ200 Bruker Quantax 200 Extended EDX System – Bruker EDX software will be transferred to new owner upon purchase • Nitrogen-free, energy-dispersive X-ray analysis system including: – SDD detector with 127 eV energy resolution or better – Detection for all elements from boron upwards – Vibration-free, maintenance-free. Peltier cooled (no nitrogen required) Lsdpfxemn Rcqo Aiisab – Pulse processor – TFT monitor – Spectrum measurement and element identification – Fully automatic, quantitative, standardless elemental analysis – Image acquisition – Ultra-fast qualitative line scan – Ultra-fast qualitative element mapping – Data management and archiving system – Report generation and results output – Data communication – Installation and user training – HyperMap – Multipoint analysis – Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (see photos) Condition: used (Subject to changes and errors in the technical data and specifications!)

Condition: excellent (used), ZEISS Type: DSM 962 The digitized scanning electron microscope DSM 962 is equipped with an integrated 4 MB image memory, a 40 MB hard disk for internal image storage and drives for external storage of data and images. hard disk for internal image storage and drives for external storage of data and images. This makes it possible to quickly and easily gain insights into the composition and morphology of morphology of specimen surfaces far into the sub-micrometer range. With magnification range from 5x to 300,000x, both macrostructures and microstructures can be examined. as well as microstructures is possible. The range of applications can be extended considerably by adding special accessories, allowing, for example analytical investigations in micro areas of the surface are possible. The device can be operated both via conventional switching elements and via the keyboard or mouse (add-on). or mouse (add-on). Electron optics and vacuum control are conventional. Functions of the Image memory functions are operated using the keyboard or mouse (add-on). A separate information screen is located centrally on the separate information screen for displaying the menus. These operating instructions are intended as a guide to help the user achieve the best possible results with the device. results with the appliance. The explanations have been kept as simple as possible so that even a less experienced user less experienced users the necessary tools. Magnification range: 20x to 300,000x at 7 mm working distance Stages in a sequence of 1-2-3-5-10 Minimum magnification: 5x at 50 mm working distance Resolution: 4 nm - guaranteed with tungsten cathode at 30 kV, 6 mm working distance, untipped specimen 25 nm - guaranteed with tungsten cathode at 1kV, 6 mm working distance, untipped specimen 3.5 nm - guaranteed with optimal LaB6 cathode at 30 kV, 6 mm working distance, untilted specimen Scope of delivery: (DSM 962 with accessories as shown) Lajdpfxefcwwno Aiieb Condition: used (Subject to changes and errors in technical data and specifications) Please ask about transportation options before purchasing. We will be happy to answer any further questions you may have over the phone.

Year of construction: 2022, condition: as good as new (ex-display), functionality: fully functional, Description (detailed configuration): o 5-axis stage o Modern, expandable user interface with EDX integration and image composition Laodexzqw Tjpfx Aiisb o SE detector o Scintillator BSE detector (retractable) o In-Lens detector o Low vacuum system with BSE detector (retractable) o Fully software-integrated JEOL-EDX system (60mm²) o In-column current measurement o Navigation camera o Live camera o Control console o Desk, PC with Windows OS, 2 x 24" monitors, keyboard

Year of construction: 2024, condition: as good as new (ex-display), functionality: fully functional, The JCM-7000 combines simple sample navigation with a range of advanced automatic functions. A large sample chamber, high resolution, and an optional low vacuum mode for non-conductive samples make this desktop SEM a versatile, mobile all-rounder. Lasdpfx Aexzqr Djiieb Features: • SE/BSE detection • Magnification up to x100,000, resolution approx. 8 nm • Low vacuum operation for non-conductive samples • Hardware and software integrated EDX system for elemental characterization • Live elemental analysis, live imaging (including 3D imaging/topography) • Intuitive operation with recipes, automatic functions, image montages, etc. • Large chamber for samples up to 80 mm diameter and 50 mm height • Compact & mobile • Dimensions (Main Unit): 324 mm W x 586 mm D x 566 mm H

Condition: used, This listing is for 1 of 2 Zeiss Standard 20 Microscope Lajdpoxzh Tfofx Aiisb

Condition: used, This listing is for a Zeiss Stemi DV4 Microscope Ljdpfx Aijxzh T Sjijab

Condition: used, This listing is for a Zeiss Axioskop Microscope Laodpoxzh Trofx Aiijb No Abjectives included

Condition: used, This listing is for a Zeiss Axioskop EL-Einsatz 5 Objectives Microscope. The unit is in full working condition and is ready for immediate release. Objective Lenses supplied: Plan 100/1.25 Plan 40X/0.66 Plan 20x/0.40 Achroplan 10x/0.25 SPL10/0.25 Zeiss Axioskop EL-Einsatz 5 Microscope Overview The Zeiss Axioskop EL-Einsatz 5 microscope is a sophisticated instrument designed for advanced microscopy tasks, particularly in research and clinical settings. Its range of objective lenses and features supports high-quality imaging and user-friendly operation. Key Features: Water Immersion: These objective lenses are designed for application in physiological salt solutions, making them perfect for examining thick biological specimens, such as brain sections. High Numerical Aperture (NA): The lenses feature high NA values (e.g., 0.80 for the 50x lens), enhancing light-gathering capability and image resolution, especially beneficial for fluorescence microscopy. Fluorescence Capabilities: The Axioskop EL-Einsatz 5 can capture fluorescent images across four channels. The system automatically adjusts brightness and white balance, simplifying the imaging process. Ergonomic Design: With an adjustable ergotube, users can comfortably position the eyepieces for extended use. Essential controls are conveniently located for ease of access. Smart Microscopy: The microscope is built for efficiency, featuring automatic adjustments that minimize the need for manual intervention, streamlining workflow. Laodpfsxxzliex Aiisb Applications: The Zeiss Axioskop EL-Einsatz 5 is suitable for a variety of applications, including: Materials Science and Metallography: Ideal for examining the microstructure of materials and conducting failure analysis. Physiology and Electrophysiology: Great for observing living cells and tissues, understanding physiological processes in real-time. Biomedical Research and Clinical Diagnostics: Useful for analysing biological samples, including histological sections and cultured cells, contributing to disease research and diagnostics. Microscopy Tasks Requiring Advanced Imaging Capabilities: Perfect for researchers needing high-resolution images and automation in their microscopy tasks.

Condition: used, This listing is for a Zeiss Standard 15 Microscope Objectives Lsdpfx Aoxzg Tqoiieab F2,5/0,08 F10.25 F40/0,65

Condition: used, functionality: unexamined, machine/vehicle number: SX-50, Used Cameca SX-50 Electron Microprobe Cameca SX-50 electron microprobe is used (Electron Probe MicroAlalyses). it has a 6” inch stage, 3 WDX Spectrometers with several Cristals LiF, PET, TAP, ODPb, PC1, PC2, PC3. Electron probe microanalysis (EPMA) are generally considered micro-analytical techniques which are able to image or analyze materials we can not generally observe with the resolution offered by visible techniques System is complete with all Books, service Manuals, Software and computer. Also many parts. 1 x Leybold Trivac D16B Vacuum Pump Ledpfx Aiownb D Tjioab 1 x Alcatel 2012 A Vacuum Pump 2 x integrated Turbo Pumps

Condition: excellent (used), Year of construction: 2019, functionality: fully functional, measuring range X-axis: 1,000 mm, measuring range Y-axis: 1,000 mm, measuring range Z-axis: 1,000 mm, ZEISS Comet®LƎD 8M 3D scanner, software + computer Laedpey Sg N Aofx Aiijb

Condition: ready for operation (used), Year of construction: 2008, travel distance X-axis: 430 mm, travel distance Y-axis: 850 mm, travel distance Z-axis: 400 mm, number of axes: 3, This 3-axis ZEISS ScanMax was manufactured in 2008. It features a travel range of 430 x 850 x 400 mm and can handle a workpiece weight up to 50 kg on its standard base frame or 20 kg on the rotary tilt table. The machine's overall dimensions are 640x1057x2080 mm. If you are looking to get high quality measuring capabilities consider the ZEISS ScanMax machine we have for sale. Contact us for more information. • Permissible workpiece weight with standard base frame: 50kg • Permissible workpiece weight with rotary tilt table: 20kg • Max. probe length: 300mm • Weight of components: • Appliance: 60kg • Underframe: 315kg • Electronic unit: 25kg • Rotary tilt table: 12kg Lsdpeyab Arofx Aiioab • Overall dimensions (LxWxH): 640 x 1057 x 2080 mmRetrofit - (HW + SW) update of the Dual PC measuring station: 25.08.2014 Latest OS version: Windows XP Measuring software: ScanWare 2.8.4/556

Condition: repair required (used), Year of construction: 2007, functionality: not functional, machine/vehicle number: 135414, measuring range X-axis: 4,200 mm, measuring range Y-axis: 1,600 mm, measuring range Z-axis: 2,100 mm, controller model: C99, No reserve price – guaranteed sale to the highest bidder! Lodpey R Taxsfx Aiijab The machine is currently not operational. There are defects on the Y-axis and Z-axis. Further details can be found in the attached service report and calibration certificate. TECHNICAL DETAILS Measuring range X: 4,200 mm Measuring range Y: 1,600 mm Measuring range Z: 2,100 mm Measuring table: 5,000 x 1,800 mm Calibrated measuring volume X-direction: 4,200 mm Y-direction: 1,600 mm Z-direction: 1,600 mm MACHINE DETAILS Control unit: C99 EQUIPMENT Probe head: TP20 #5M2409 Measuring software: CMM-OS 5.4.00 CAA File: 03.06.2025 Calibration sphere: #134983 Note: The measuring computer HP Z420 Windows 7 can be supplied upon request. Please note this device has a virus infection caused by a hacker attack.

Condition: ready for operation (used), Zeiss 608093 9203 ÄZ02 35/05 Path measurement 32 Prismo / Wegmessung 32 Prismo-ST 608093-9203-701, used, as good as new condition, 100% functional Ljdpfx Aioy T Dp Aoijab

Condition: ready for operation (used), Year of construction: 1986, Offered is a 3D coordinate measuring machine. Working area X/Y/Z: 850mm/1200mm/600mm, probe holder: Renishaw PH10M, table surface: granite plate, resolution: 0.1µm, air supply: 5bar, control: Zeiss CMM Controller. Equipped with control panel with joystick, SCR200 probe change magazine, calibration sphere, extensive probe accessories. Weight: approx. 2400kg, overall dimensions X/Y/Z: approx. 2100mm/1900mm/2350mm. Inspection possible by arrangement. Ljdpfey T N H Tjx Aiijab

Condition: used, 3D Coordinate Measuring Machine ZEISS NUMEREX - Not Functional Granite Measuring Table, Granite Surface Plate, Measuring Table Model No. 3648-18, Serial No. X-1019, Year of Manufacture approx. 1986 Measuring Range X = approx. 1250 mm, Y = approx. 900 mm, Z = approx. 400 mm Measuring Plate L x W 1525 x 1435 mm Usable Surface 1525 x 1100 mm Plate Thickness 305 mm Clearance Width in the Portal 1100 mm Probe Mount Ø 9.5 mm Compressed Air Connection 6 bar Power Supply 230 Volt, 50 Hz - Granite plate with steel inserts with internal threads - Axis adjustment with pneumatic slide guide for X, Y, and Z axis - Plate mounted on base frame with 5 leveling feet, 3 support plates for the feet Laodpfxefy U Ews Aiijb - Computer and software missing (not available and not included) → not functional! Space required for the measuring machine L x W x H 1600 x 1850 x 2200 mm Machine weight approx. 2.8 tons Plate is damaged on one side – see photo, otherwise in good condition

Condition: ready for operation (used), Year of construction: 2001, Table dimensions X/Y/Z: 4800mm/3000mm, measuring range X/Y/Z: 5000mm/2600mm/2100mm, grid spacing: 50mm, travel speed: 150mm/s, weight: approx. 540kg. Documentation available. An on-site inspection is possible. Lsdpfx Aioy R Dr Ssijab

Condition: used, Year of construction: 2011, Measuring machine Zeiss MC 850, year of manufacture 2011 Laedpfx Aey R S Nfjiieb

Condition: ready for operation (used), Year of construction: 2003, A CNC coordinate measuring machine Zeiss calibrated at the end of 2025 is available. Measuring dimensions X/Y/Z: 1200mm/1800mm/1000mm, max. workpiece weight: 2000kg, length measurement deviation: 2µm/L300, resolution: 0.2µm, measuring rate: 200/s, max. stylus length: 800mm, max. probe mass: 600g, measuring head: VAST Gold Scanning. Machine dimensions X/Y/Z: approx. 3000mm/2050mm/3550mm, weight: approx. 6000kg. Without grid plate, probe rack, software license and computer. Documentation available. An on-site inspection is possible. Ledpfsy Nm Ugjx Aiisab

Condition: refurbished (used), Used 3D CNC coordinate measuring machine. Laodpoy Nzr Tofx Aiiob ZEISS Eclipse 7.7.5 – fully modernized in 2026 with a new UCC-S3 controller, PH10M rotary-swivel system, joystick box, SP25 scanning probe, and a PC with RationaDMIS 3D software. Further details available upon request Measuring range X = 700 mm - Y = 700 mm - Z = 500 mm Price: upon request ᐳᐳᐳ One-of-a-kind item - while available ᐸᐸᐸ Request our detailed quote. Of course, we provide all services such as installation, maintenance, service, training, programming, etc.

Condition: used, Used 3D CNC coordinate measuring machine. ZEISS Prismo 7 – upgraded in 2016 with UCC control, PH10M rotary-head-system, joystick box, SP25 scanning probe, and a PC with RationaDMIS 3D software. Further details available upon request Measuring range X = 900 mm - Y = 1200 mm - Z = 700 mm Ledsy Nzk Aopfx Aiisab Price: upon request ᐳᐳᐳ One-of-a-kind item - while available ᐸᐸᐸ Request our detailed quote. Of course, we provide all services such as installation, maintenance, service, training, programming, etc.

Condition: good (used), Year of construction: 2012, functionality: fully functional, measuring range X-axis: 400 mm, measuring range Y-axis: 400 mm, measuring range Z-axis: 200 mm, travel distance X-axis: 400 mm, travel distance Y-axis: 400 mm, travel distance Z-axis: 200 mm, input voltage: 230 V, Equipment: lighting, type plate available, Year of manufacture: 2012 Tactile: Vast XXT E0 X/Y (1D) in [μm] at 20 ±2 °C 1.7 + L/250 E0 XY (2D) in [μm] at 20 ±2 °C 1.7 + L/250 E0 (3D) in [μm] at 20 ±2 °C 1.9 + L/250 Scanning probing deviation MPE according to ISO 10360-4:2000 THP at 2.7 [μm] Single probe probing deviation form MPE according to ISO 10360-5:2010 PFTU 1.9 [μm] Camera system: Zeiss Discovery 12 EB X/Y (1D) 5) in [μm] at 20 ±2 °C 1.7 + L/250 EB XY (2D) 5) in [μm] at 20 ±2 °C 1.7 + L/250 Probe deviation MPE according to ISO 10360-7:2011 PF2D 5) 1.7 [μm] Probe deviation of the image processing system MPE according to ISO 10360-7:2011 PFV2D 5) 1.2 [μm] Lodpfouq Nfhjx Aiieab Possible services: delivery, commissioning

Condition: excellent (used), functionality: fully functional, Very comprehensive Zeiss probe set including case, in excellent condition. Lajdpfx Aijy Ni Snoisb Comes with various probes. All with M5 thread and shafts made of steel, ceramic, carbon fiber, star probes, etc. See pictures.

Condition: refurbished (used), functionality: fully functional, Used machine retrofitted with new CNC-controller and new 3D-geometry-software Ljdpfx Asxzp U Deiijab The equipment of the measuring machine is freely selectable. We procure the right components from the customer "just in time". Machine will be modernized with new controller, probe head, probes from Renishaw, PC and 3D software RationalDMIS. Technical Data: Measuring Range apprx: X = 1.000 mm - Y = 1.200 mm - Z = 600 mm Accurracy: MPEE : 1.9+L/300 according the manufacturers specification Illustrations still with original probe configuration Price on request >>> single machine - as long as available